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说明
Tester配置
无配置OEM 型号描述
The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identification and hardening of sensitive structures prior to full-scale production. Given the extremely high cost of IC production, as well as customer demands for precisely timed component delivery schedules, the Orion3 can save substantial costs in terms of time, material and lost opportunity (time to market). The high resolution dual cameras permit easy and rapid discharge pin alignment during the test setup routine. Both the x and y axis are displayed simultaneously. The cameras may be left on during the test to monitor the pin alignment. Vacuum hold-down enables device testing regardless of device types and sizes.文件
无文件
PREFERRED
SELLER
类别
Final Test
上次验证： 60 多天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121860
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
SELLER
THERMO / KEYTEK
ORION3
类别
Final Test
上次验证： 60 多天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121860
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Tester配置
无配置OEM 型号描述
The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identification and hardening of sensitive structures prior to full-scale production. Given the extremely high cost of IC production, as well as customer demands for precisely timed component delivery schedules, the Orion3 can save substantial costs in terms of time, material and lost opportunity (time to market). The high resolution dual cameras permit easy and rapid discharge pin alignment during the test setup routine. Both the x and y axis are displayed simultaneously. The cameras may be left on during the test to monitor the pin alignment. Vacuum hold-down enables device testing regardless of device types and sizes.文件
无文件