说明
无说明配置
・Light source; argon-ion laser (λ = 488 nm, and 20 mW) detection method; scattered light detection method; spiral scanning method maximum detection sensitivity (practical measurable particle size); 0.100 μm dynamic range; 0.100 to 5.153 μm (calibrated with standard particles) detection reproducibility; (σn/X) × 100 with 1% or less cleanliness of equipment; 0.5 or less with a total number of counts of 0.100 μm or moreOEM 型号描述
未提供文件
无文件
TAKANO / TOPCON
WM-1500
已验证
类别
Mask Inspection
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
26025
晶圆尺寸:
6"/150mm, 8"/200mm
年份:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部TAKANO / TOPCON
WM-1500
类别
Mask Inspection
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
26025
晶圆尺寸:
6"/150mm, 8"/200mm
年份:
1997
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
・Light source; argon-ion laser (λ = 488 nm, and 20 mW) detection method; scattered light detection method; spiral scanning method maximum detection sensitivity (practical measurable particle size); 0.100 μm dynamic range; 0.100 to 5.153 μm (calibrated with standard particles) detection reproducibility; (σn/X) × 100 with 1% or less cleanliness of equipment; 0.5 or less with a total number of counts of 0.100 μm or moreOEM 型号描述
未提供文件
无文件