说明
Wafer Characterization配置
无配置OEM 型号描述
The WaferCheck 7000 series of products are flexible, modular systems capable of automatically characterizing, inspecting and sorting semiconductor wafers. The WaferCheck 7000, the first large-scale, automated metrology system for the wafer manufacturing market.文件
无文件
类别
Metrology
上次验证： 14 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147584
晶圆尺寸：
6"/150mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / ADE
WAFERCHECK 7000
类别
Metrology
上次验证： 14 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147584
晶圆尺寸：
6"/150mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer Characterization配置
无配置OEM 型号描述
The WaferCheck 7000 series of products are flexible, modular systems capable of automatically characterizing, inspecting and sorting semiconductor wafers. The WaferCheck 7000, the first large-scale, automated metrology system for the wafer manufacturing market.文件
无文件