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CAMECA IMS-4F
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    文件

    CAMECA

    IMS-4F

    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    59344


    晶圆尺寸:

    未知


    年份:

    未知

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    类似上架物品
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    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology
    年份: 0状况: 二手
    上次验证60 多天前

    CAMECA

    IMS-4F

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 60 多天前
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/6027a6c6966e452c84838e38578e628e_labspettrometriamassaionisecondarifig1_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/7018c249ae3a4cb89a782aa35ba9ca62_labspettrometriamassaionisecondarifig2_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/5fc16fa72d9a45638a4b5862c3cbd5ca_labspettrometriamassaionisecondarifig3_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/f13014b6090a4b92ac6128cf5d69b72b_labspettrometriamassaionisecondarifig7_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/ab7df4728de24c968735e271aaf17ccd_1902f26f8f1844638b6c54599010528a1201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    59344


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    文件
    类似上架物品
    查看全部
    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology年份: 0状况: 二手上次验证: 60 多天前