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KLA RS35
    说明
    Tencor / Prometrix RS 35 (RS35) 4PP *. Refurbished *. Installed in Clean-room
    配置
    *. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Silicon wafer - Measurement range <5 mohm/sq to > 5 Megohm/sq - Routine check 1-30 sites programmable - Counter/ 3-D map, Diameter scan 49,81,121,225,361,441,625 sites - XY map up to 1200 sites programmable *. Measurement Specifications - Measurement repeatability <0.2% ( 1 Sigma) - Absolute accuracy based on NIST(NBS) standard wafers +-1% of NIST certified range *. Hardware configuration: - Radial Stage and Probe head Assembly - Electronics Card Cage ( CPU and I/O Chanel, Motor Controller, Display I/O, RS232 Part..) - Diagnostics Pannel - DC Power supply - Operator Console with keyboard *. Wafer Size: 2"~ 8" *. Software configuration: - Operation Software: StatTrax *. Utility & power - power requirements 115v 50/60hz - Required compressed Air 80 ~100 PSI , Vacuum : 25 mmHg
    OEM 型号描述
    未提供
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    KLA

    RS35

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    已验证

    类别

    Metrology
    上次验证: 28 天前
    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    66001


    晶圆尺寸:

    8"/200mm


    年份:

    1998

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    Transaction Insured by Moov
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    类似上架物品
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    KLA RS35
    KLARS35Metrology
    年份: 1998状况: 翻新
    上次验证28 天前

    KLA

    RS35

    verified-listing-icon

    已验证

    类别

    Metrology
    上次验证: 28 天前
    listing-photo-1991d9ffc107489d8d1d5ce04ce67711-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    66001


    晶圆尺寸:

    8"/200mm


    年份:

    1998


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Tencor / Prometrix RS 35 (RS35) 4PP *. Refurbished *. Installed in Clean-room
    配置
    *. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Silicon wafer - Measurement range <5 mohm/sq to > 5 Megohm/sq - Routine check 1-30 sites programmable - Counter/ 3-D map, Diameter scan 49,81,121,225,361,441,625 sites - XY map up to 1200 sites programmable *. Measurement Specifications - Measurement repeatability <0.2% ( 1 Sigma) - Absolute accuracy based on NIST(NBS) standard wafers +-1% of NIST certified range *. Hardware configuration: - Radial Stage and Probe head Assembly - Electronics Card Cage ( CPU and I/O Chanel, Motor Controller, Display I/O, RS232 Part..) - Diagnostics Pannel - DC Power supply - Operator Console with keyboard *. Wafer Size: 2"~ 8" *. Software configuration: - Operation Software: StatTrax *. Utility & power - power requirements 115v 50/60hz - Required compressed Air 80 ~100 PSI , Vacuum : 25 mmHg
    OEM 型号描述
    未提供
    文件

    无文件

    类似上架物品
    查看全部
    KLA RS35
    KLA
    RS35
    Metrology年份: 1998状况: 翻新上次验证: 28 天前