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KLA ARCHER 10
    说明
    KLA-Tencor Archer 10 Automated Optical Overlay Metrology
    配置
    Overlay
    OEM 型号描述
    Archer 10 is an Automated Optical Overlay Metrology product that provides control of overlay error budget for sub-0.13-micron production, increases throughput by 30%, and allows consistent measurement of low-contrast targets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
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    KLA

    ARCHER 10

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    已验证

    类别

    Metrology
    上次验证: 30 天前
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    93087


    晶圆尺寸:

    未知


    年份:

    未知

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    KLA

    ARCHER 10

    verified-listing-icon

    已验证

    类别

    Metrology
    上次验证: 30 天前
    listing-photo-49db563ada8b4712893d69ce9ffe82bd-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/49db563ada8b4712893d69ce9ffe82bd/09b25c3784094487901e7c802e26df81_d639435836f14d60998a63d7b497733a1201a_mw.jpeg
    listing-photo-49db563ada8b4712893d69ce9ffe82bd-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/49db563ada8b4712893d69ce9ffe82bd/79bda2aaf0cc4522aaabb3fc0add5f45_0194529229f44c95a518091792cf24471201a_mw.jpeg
    listing-photo-49db563ada8b4712893d69ce9ffe82bd-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/49db563ada8b4712893d69ce9ffe82bd/6fe679fe251a4b34ba9cac4dc2e73a71_82534abe08d148eda2825c2400fb3d021201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    93087


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    KLA-Tencor Archer 10 Automated Optical Overlay Metrology
    配置
    Overlay
    OEM 型号描述
    Archer 10 is an Automated Optical Overlay Metrology product that provides control of overlay error budget for sub-0.13-micron production, increases throughput by 30%, and allows consistent measurement of low-contrast targets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
    文件

    无文件

    类似上架物品
    查看全部

    无类似上架物品