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市场 > Metrology > KLA > ARCHER 100

ARCHER 100

类别
Metrology
概述

The Archer 100 optical overlay control system is a cost-effective and high-performance solution for advanced design rules and immersion lithography. It has a lower total measurement uncertainty, improved tool utilization, and is extendible to address future lithography challenges. It also features automatic recipe optimization to minimize human error and free up fab resources.

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