说明
无说明配置
Missing: Power Supply - AC-DC PS Vacuum Board Cable Pneumatic box's air one touch connector Clamp cylinder sensor LP3 HUB USB Port Ethernet Switch - 8 Port Ionizer Controller Power Supply - FEC PS FEC Fixture Panel (bottom) Malfunction: Pneumatic Box V3 USB 3.0 4 Port Panel Mount Hub Robot Controller Pre-aligner CPU LP3 I/F LP3 Shinko Mapper Motor with Brake Shinko Fiber-Optic Amplifier SensorOEM 型号描述
The Archer 300 LCM is a high-performance, low-cost metrology system for 2Xnm logic and 1Xnm half-pitch memory devices. It offers precision, fast measurement speed, and in-field metrology capability. Improvements to the imaging-based optical subsystem result in better overlay measurement specifications than the previous-generation Archer 200. The system provides cost-effective characterization of overlay error and CD on lithography process layers for double patterning and other advanced technologies. It is also seamlessly integrated with K-T Analyzer, an advanced data analysis system, and Recipe Database Manager (RDM), a centralized database of production-proven recipe components. The Archer 300 LCM is suitable for double patterning technologies, scanner qualification, and in-line monitoring.文件
无文件
KLA
ARCHER 300
已验证
类别
Metrology
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
44347
晶圆尺寸：
未知
年份：
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
ARCHER 300
已验证
类别
Metrology
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
44347
晶圆尺寸：
未知
年份：
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Missing: Power Supply - AC-DC PS Vacuum Board Cable Pneumatic box's air one touch connector Clamp cylinder sensor LP3 HUB USB Port Ethernet Switch - 8 Port Ionizer Controller Power Supply - FEC PS FEC Fixture Panel (bottom) Malfunction: Pneumatic Box V3 USB 3.0 4 Port Panel Mount Hub Robot Controller Pre-aligner CPU LP3 I/F LP3 Shinko Mapper Motor with Brake Shinko Fiber-Optic Amplifier SensorOEM 型号描述
The Archer 300 LCM is a high-performance, low-cost metrology system for 2Xnm logic and 1Xnm half-pitch memory devices. It offers precision, fast measurement speed, and in-field metrology capability. Improvements to the imaging-based optical subsystem result in better overlay measurement specifications than the previous-generation Archer 200. The system provides cost-effective characterization of overlay error and CD on lithography process layers for double patterning and other advanced technologies. It is also seamlessly integrated with K-T Analyzer, an advanced data analysis system, and Recipe Database Manager (RDM), a centralized database of production-proven recipe components. The Archer 300 LCM is suitable for double patterning technologies, scanner qualification, and in-line monitoring.文件
无文件