跳至主要内容
市场 > Profiler > KLA > HRP-200

HRP-200

类别
Profiler
概述

The Tencor HRP-200 High-Resolution Profiler is a fully-automated system that provides global and local analysis of wafer surface topography. It can measure surface topography on both macroscopic and microscopic scales, combining long scans with fine-area analysis of submicron features. It allows process engineers to quickly compare feature depths and relative surface heights. It also combines the measurement repeatability and ease of use of a Tencor stylus profiler with the high-resolution analysis and imaging capabilities of an Atomic Force Microscope (AFM).

活动的上架物品

0

服务

检验、保险、评估、物流

热门上架物品

    未找到产品
有类似物品吗?
使用 Moov 上架,立即找到完美买家。