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KOBELCO / LEO LTA 700
    说明
    Wafer Lifetime Mesurement System
    配置
    无配置
    OEM 型号描述
    LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
    文件

    无文件

    KOBELCO / LEO

    LTA 700

    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证: 30 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115092


    晶圆尺寸:

    6"/150mm


    年份:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    Metrology
    年份: 1997状况: 二手
    上次验证30 多天前

    KOBELCO / LEO

    LTA 700

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 30 多天前
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/b239050e45e341d18aa4e32aba9b4812_1_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/a3b504f56c2d4fb88049bfd15a6c02c0_2_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/9d9421b46e8c4fc4afa008a844b24da5_3_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61f1cc918d2b44569d801ed69261bb47_4_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/5e528d6f8bf94c6c8b3b368ff85bfc7b_5_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/c294cb1c75534416b51abf1c04237488_6_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61cf7ad28bd9451f830f20504beea2ff_7_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/70e6c6972f8f43939b979e81298a41b6_8_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61d9742724ae4ad78c0f9a56ff055ade_9_mw.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115092


    晶圆尺寸:

    6"/150mm


    年份:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Wafer Lifetime Mesurement System
    配置
    无配置
    OEM 型号描述
    LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
    文件

    无文件

    类似上架物品
    查看全部
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    Metrology年份: 1997状况: 二手上次验证:30 多天前
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    Metrology年份: 1997状况: 二手上次验证:60 多天前