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KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
  • KOBELCO / LEO LTA 700
说明
Wafer Lifetime Mesurement System
配置
无配置
OEM 型号描述
LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
文件

无文件

类别
Metrology

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

115092


晶圆尺寸:

6"/150mm


年份:

1997


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KOBELCO / LEO

LTA 700

verified-listing-icon
已验证
类别
Metrology
上次验证: 60 多天前
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/b239050e45e341d18aa4e32aba9b4812_1_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/a3b504f56c2d4fb88049bfd15a6c02c0_2_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/9d9421b46e8c4fc4afa008a844b24da5_3_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61f1cc918d2b44569d801ed69261bb47_4_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/5e528d6f8bf94c6c8b3b368ff85bfc7b_5_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/c294cb1c75534416b51abf1c04237488_6_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61cf7ad28bd9451f830f20504beea2ff_7_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/70e6c6972f8f43939b979e81298a41b6_8_mw.png
listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61d9742724ae4ad78c0f9a56ff055ade_9_mw.png
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

115092


晶圆尺寸:

6"/150mm


年份:

1997


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer Lifetime Mesurement System
配置
无配置
OEM 型号描述
LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
文件

无文件