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说明
Wire bonding machine配置
无配置OEM 型号描述
The Metra 7200 is Nanometrics’ advanced overlay metrology and CD measurement system. The Metra’s high throughput and on-board, real-time, stepper-specific modeling provides the fastest time-to-decision for making accurate stepper adjustments. The Metra’s stepper-specific modeling software analyzes every unique stage and lens term to provide the tightest overlay possible, directly improving device performance and yield. Complete analysis can be performed for any stepper including Nikon, Canon, SVGL and Ultratech. The Metra’s analysis uses an embedded version of the ARGUS® stepper modeling library developed by New Vision Systems. In addition, the system’s multi-tasking Windows NT®-based software allows engineering functions, such as recipe creation, to occur simultaneously while production wafers are being measured, thus providing high equipment utilization.文件
无文件
类别
Metrology
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
65409
晶圆尺寸：
未知
年份：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NANOMETRICS / METRA
7200
类别
Metrology
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
65409
晶圆尺寸：
未知
年份：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wire bonding machine配置
无配置OEM 型号描述
The Metra 7200 is Nanometrics’ advanced overlay metrology and CD measurement system. The Metra’s high throughput and on-board, real-time, stepper-specific modeling provides the fastest time-to-decision for making accurate stepper adjustments. The Metra’s stepper-specific modeling software analyzes every unique stage and lens term to provide the tightest overlay possible, directly improving device performance and yield. Complete analysis can be performed for any stepper including Nikon, Canon, SVGL and Ultratech. The Metra’s analysis uses an embedded version of the ARGUS® stepper modeling library developed by New Vision Systems. In addition, the system’s multi-tasking Windows NT®-based software allows engineering functions, such as recipe creation, to occur simultaneously while production wafers are being measured, thus providing high equipment utilization.文件
无文件