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ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL
    说明
    Film Thickness Measurement System
    配置
    无配置
    OEM 型号描述
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
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    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证: 17 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    104576


    晶圆尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology
    年份: 0状况: 二手
    上次验证17 天前

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 17 天前
    listing-photo-88c366d2fa174c5dbb22a6d7999573f8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    104576


    晶圆尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Film Thickness Measurement System
    配置
    无配置
    OEM 型号描述
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    文件

    无文件

    类似上架物品
    查看全部
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology年份: 0状况: 二手上次验证:17 天前