说明
无说明配置
Maximum size: 210×210 mm. Semi-automatic measuring instrument of resistivity / sheet resistance by 4 point probe method Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc) Conductive thin film (Metal, ITO etc) Diffused sample , Silicone thin film(LTPS,etc ) Silicon-related epitaxial materials, Ion-implantation sampleOEM 型号描述
未提供文件
无文件
NAPSON
RG-200PV
已验证
类别
Metrology
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
114433
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NAPSON
RG-200PV
类别
Metrology
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
114433
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Maximum size: 210×210 mm. Semi-automatic measuring instrument of resistivity / sheet resistance by 4 point probe method Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc) Conductive thin film (Metal, ITO etc) Diffused sample , Silicone thin film(LTPS,etc ) Silicon-related epitaxial materials, Ion-implantation sampleOEM 型号描述
未提供文件
无文件