
说明
Film thickness measurement system配置
无配置OEM 型号描述
A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.文件
无文件
类别
Metrology
上次验证: 10 天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
153395
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
OTSUKA / TEKNOLOGUE
FE-3000
类别
Metrology
上次验证: 10 天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
153395
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Film thickness measurement system配置
无配置OEM 型号描述
A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.文件
无文件