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OTSUKA / TEKNOLOGUE FE-3000
    说明
    Film thickness measurement system
    配置
    无配置
    OEM 型号描述
    A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.
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    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证: 10 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    153395


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    OTSUKA / TEKNOLOGUE FE-3000

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    FE-3000

    Metrology
    年份: 0状况: 二手
    上次验证10 天前

    OTSUKA / TEKNOLOGUE

    FE-3000

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 10 天前
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/0c69814006344cd9a0c789e30667be21_1000004579scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/e808658681584ed3b8339f33ca4210ad_1000004582scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/cd6d012f157844fcbd5d2cf697f81a55_1000004581scrubbed_mw.jpeg
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    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    153395


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Film thickness measurement system
    配置
    无配置
    OEM 型号描述
    A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.
    文件

    无文件

    类似上架物品
    查看全部
    OTSUKA / TEKNOLOGUE FE-3000

    OTSUKA / TEKNOLOGUE

    FE-3000

    Metrology年份: 0状况: 二手上次验证:10 天前