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SENSOFAR PLu NEOX
    说明
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    OEM 型号描述
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
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    SENSOFAR

    PLu NEOX

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    已验证

    类别
    Metrology

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    77624


    晶圆尺寸:

    未知


    年份:

    未知

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    类似上架物品
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    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Metrology
    年份: 2011状况: 二手
    上次验证4 天前

    SENSOFAR

    PLu NEOX

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 60 多天前
    listing-photo-5c9985c03af146d9a81d6a84ba2b210a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    77624


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
    文件

    无文件

    类似上架物品
    查看全部
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Metrology年份: 2011状况: 二手上次验证: 4 天前
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Metrology年份: 0状况: 二手上次验证: 60 多天前