说明
Dual Beam Ion SEM-FIB配置
230V; 15 A 50/60HzOEM 型号描述
The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.文件
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA 200 NANOLAB
已验证
类别
Microscope
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
82219
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA 200 NANOLAB
类别
Microscope
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
82219
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Dual Beam Ion SEM-FIB配置
230V; 15 A 50/60HzOEM 型号描述
The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.文件
无文件