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说明
Camera model C8250-23; PC OS Windows Vista配置
无配置OEM 型号描述
The PHEMOS-1000 is a high-res emission microscope for pinpointing semiconductor device failures by detecting weak light and heat emissions caused by defects. It seamlessly integrates with a general-purpose prober, leveraging familiar sample setups for versatile analysis. Optional laser scan system enables high-res pattern images. Multiple detectors cater to diverse analysis techniques. Different types of detectors are available for various analysis techniques such as emission analysis, thermal analysis, and IR-OBIRCH analysis. The PHEMOS-1000 supports a wide variety of tasks and applications ranging from prober socket boards to a large-size 300 mm wafer prober文件
无文件
类别
Microscope
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
117578
晶圆尺寸：
未知
年份：
2009
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HAMAMATSU
PHEMOS-1000
类别
Microscope
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
117578
晶圆尺寸：
未知
年份：
2009
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Camera model C8250-23; PC OS Windows Vista配置
无配置OEM 型号描述
The PHEMOS-1000 is a high-res emission microscope for pinpointing semiconductor device failures by detecting weak light and heat emissions caused by defects. It seamlessly integrates with a general-purpose prober, leveraging familiar sample setups for versatile analysis. Optional laser scan system enables high-res pattern images. Multiple detectors cater to diverse analysis techniques. Different types of detectors are available for various analysis techniques such as emission analysis, thermal analysis, and IR-OBIRCH analysis. The PHEMOS-1000 supports a wide variety of tasks and applications ranging from prober socket boards to a large-size 300 mm wafer prober文件
无文件