说明
-Microscope and Accessories (NIKON Laboratory) High Magnification OM Microscope Nikon ME600 -Lamp Base Malfunction配置
无配置OEM 型号描述
The microscope is primarily intended for inspection of wafers or chips after development and/or evaporation. It is equipped with an incident (epi) illuminating unit (light is coming from above the specimen) with a Differential Interference Contrast option. It is also equipped with Dark Field option.文件
无文件
NIKON
ECLIPSE ME600
已验证
类别
Microscope
上次验证: 30 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
100712
晶圆尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部NIKON
ECLIPSE ME600
类别
Microscope
上次验证: 30 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
100712
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
-Microscope and Accessories (NIKON Laboratory) High Magnification OM Microscope Nikon ME600 -Lamp Base Malfunction配置
无配置OEM 型号描述
The microscope is primarily intended for inspection of wafers or chips after development and/or evaporation. It is equipped with an incident (epi) illuminating unit (light is coming from above the specimen) with a Differential Interference Contrast option. It is also equipped with Dark Field option.文件
无文件