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OLYMPUS MX61L
    说明
    Olympus MX61 metallographic microscope 1. Eyepiece: SWN 10X/222. Observation tube: Three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Backlight module 6. Objective lens: BD 5X, 10X ,20X, 50X7. CCD adapter mirror 8. Mobile bed: 12"STAGE
    配置
    无配置
    OEM 型号描述
    The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.
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    verified-listing-icon

    已验证

    类别
    Microscope

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    108132


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    OLYMPUS

    MX61L

    verified-listing-icon
    已验证
    类别
    Microscope
    上次验证: 60 多天前
    listing-photo-d111fc038d30487bb805c46604c93b7e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    108132


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Olympus MX61 metallographic microscope 1. Eyepiece: SWN 10X/222. Observation tube: Three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Backlight module 6. Objective lens: BD 5X, 10X ,20X, 50X7. CCD adapter mirror 8. Mobile bed: 12"STAGE
    配置
    无配置
    OEM 型号描述
    The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.
    文件

    无文件