We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 阅读更多
说明
Trinocular viewer 532 nm and 780 nm excitation wavelength 20 X and 50 X objectives Brightfield illumination Includes computer and software配置
无配置OEM 型号描述
One of the DXR microscope’s greatest strengths is its ability to positively identify materials using Raman’s fingerprinting nature combined with years of molecular identification experience and algorithm development. The DXR spectrometer has the largest commercially available collection of searchable spectra to identify unknown materials in the world, with more being added all the time. Our patented* multi-component searching decodes complex samples and provides visual proof of constituents in a material, taking all the labor and uncertainty out of materials identification.文件
无文件
类别
Microscope
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
75550
晶圆尺寸：
未知
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC
DXR RAMAN
类别
Microscope
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
75550
晶圆尺寸：
未知
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Trinocular viewer 532 nm and 780 nm excitation wavelength 20 X and 50 X objectives Brightfield illumination Includes computer and software配置
无配置OEM 型号描述
One of the DXR microscope’s greatest strengths is its ability to positively identify materials using Raman’s fingerprinting nature combined with years of molecular identification experience and algorithm development. The DXR spectrometer has the largest commercially available collection of searchable spectra to identify unknown materials in the world, with more being added all the time. Our patented* multi-component searching decodes complex samples and provides visual proof of constituents in a material, taking all the labor and uncertainty out of materials identification.文件
无文件