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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA ARCHER 200
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
    文件

    无文件

    KLA

    ARCHER 200

    verified-listing-icon

    已验证

    类别
    Overlay

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    87792


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay
    年份: 0状况: 二手
    上次验证5 天前

    KLA

    ARCHER 200

    verified-listing-icon
    已验证
    类别
    Overlay
    上次验证: 60 多天前
    listing-photo-e433b8b6b23e43bb85f538517eba3b98-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    87792


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
    文件

    无文件

    类似上架物品
    查看全部
    KLA ARCHER 200

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    Overlay年份: 0状况: 二手上次验证:5 天前
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    Overlay年份: 0状况: 二手上次验证:30 多天前
    KLA ARCHER 200

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    ARCHER 200

    Overlay年份: 0状况: 二手上次验证:60 多天前