说明
无说明配置
Small Test Head C400e 56M Channel Board x 18pcs (upgraded) P600 56M x 2 (upgraded) XW8200 workstation GPDPS x 1 pcOEM 型号描述
The VERIGY C400E is a Final test system designed for semiconductor testing applications. It features an LTH (Big) test head, DUT Scale, and 56M scan memory, ensuring comprehensive testing capabilities. The system is equipped with seven GPDPS Power supplies, enabling efficient and accurate power delivery. Additionally, the C400E is equipped with High Speed Cards to cater to high-speed testing requirements, making it a powerful and versatile solution for final testing of semiconductor devices.文件
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ADVANTEST / VERIGY
C400E
已验证
类别
Parts
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
59815
晶圆尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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C400E
类别
Parts
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
59815
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Small Test Head C400e 56M Channel Board x 18pcs (upgraded) P600 56M x 2 (upgraded) XW8200 workstation GPDPS x 1 pcOEM 型号描述
The VERIGY C400E is a Final test system designed for semiconductor testing applications. It features an LTH (Big) test head, DUT Scale, and 56M scan memory, ensuring comprehensive testing capabilities. The system is equipped with seven GPDPS Power supplies, enabling efficient and accurate power delivery. Additionally, the C400E is equipped with High Speed Cards to cater to high-speed testing requirements, making it a powerful and versatile solution for final testing of semiconductor devices.文件
无文件