说明
Main electronics controller Missing Prober top section (robot + sensors + optical alignment) Missing Chuck / platen Likely missing or partially present Test head docking ring Present (lower section) Wafer cassette elevator (right) Present Power modules & pneumatics Some present Side/top covers Partially included - at least one Automatically loads wafers from FOUP/cassette Moves wafer into position under a thermal or electrical test head Provides X/Y/Z/Theta precision alignment Interfaces with ATE systems for: wafer acceptance testing burn-in reliability stress testing (HTOL / LTOL / cycling) parametric wafer probe It is a very high-precision electromechanical platform used in semiconductor fabs (Intel, TSMC, Samsung, Altera—the label confirms Altera owned this one).配置
无配置OEM 型号描述
未提供文件
无文件
类别
Parts
上次验证： 13 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
150385
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TEL / TOKYO ELECTRON
4072A
类别
Parts
上次验证： 13 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
150385
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Main electronics controller Missing Prober top section (robot + sensors + optical alignment) Missing Chuck / platen Likely missing or partially present Test head docking ring Present (lower section) Wafer cassette elevator (right) Present Power modules & pneumatics Some present Side/top covers Partially included - at least one Automatically loads wafers from FOUP/cassette Moves wafer into position under a thermal or electrical test head Provides X/Y/Z/Theta precision alignment Interfaces with ATE systems for: wafer acceptance testing burn-in reliability stress testing (HTOL / LTOL / cycling) parametric wafer probe It is a very high-precision electromechanical platform used in semiconductor fabs (Intel, TSMC, Samsung, Altera—the label confirms Altera owned this one).配置
无配置OEM 型号描述
未提供文件
无文件