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ACCRETECH / TSK UF3000LX
  • ACCRETECH / TSK UF3000LX
说明
无说明
配置
Docked Tester: ST6731A OS: S8.39.FC Hinge Model: MHF4000EX Auto Card Change: Include Chuck Type: Nickel/Hot Chuck Temp: 30℃~150℃ Cleaning Unit: Include Tester I/F: GPIB OCR: 0 Inker: 0 Ethernet: 0 Initialization: 0 Missing/Defective: None
OEM 型号描述
The ACCRETECH / TSK UF3000LX is a probing machine that performs electrical tests of each chip on a wafer, ensuring the quality of semiconductor devices. It is a prober with high-speed probing that targets non-memory devices. High-speed and low-vibration are achieved by adopting the newly developed exclusive XY driving system. Compared with existing products, it has a smaller footprint due to design changes and has reduced power consumption by 10% in consideration for the environment.
文件

无文件

PREFERRED
 
SELLER
类别
Probers

上次验证: 60 多天前

Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

111368


晶圆尺寸:

未知


年份:

2016


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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PREFERRED
 
SELLER

ACCRETECH / TSK

UF3000LX

verified-listing-icon
已验证
类别
Probers
上次验证: 60 多天前
listing-photo-41f90534e5fc43d0920e1f6da383eb3a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/40655/41f90534e5fc43d0920e1f6da383eb3a/b16450a62caa4c8ba0d7fd3af0977e1b_kakaotalk20240814165852123110_mw.jpg
Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

111368


晶圆尺寸:

未知


年份:

2016


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
Docked Tester: ST6731A OS: S8.39.FC Hinge Model: MHF4000EX Auto Card Change: Include Chuck Type: Nickel/Hot Chuck Temp: 30℃~150℃ Cleaning Unit: Include Tester I/F: GPIB OCR: 0 Inker: 0 Ethernet: 0 Initialization: 0 Missing/Defective: None
OEM 型号描述
The ACCRETECH / TSK UF3000LX is a probing machine that performs electrical tests of each chip on a wafer, ensuring the quality of semiconductor devices. It is a prober with high-speed probing that targets non-memory devices. High-speed and low-vibration are achieved by adopting the newly developed exclusive XY driving system. Compared with existing products, it has a smaller footprint due to design changes and has reduced power consumption by 10% in consideration for the environment.
文件

无文件

类似上架物品
查看全部