说明
Engineering Wafer Prober配置
Confirm Standard Configuration includes: Stage:12" Travel of Stage:301 mm x 301 mm Theta travel:± 7.5 degrees Microscope spec:Optem A-Zoom Options: Head Stage:NA Test Head Connection Jig:NA Ambient/Room Temp Chuck:-55°C to 200°C Heater ( Yes/No ):Yes (Thermal Controller and Chiller) GP-IB Interface:Yes RS232 Interface:NA Light Source:Yes Table:NA Manuals:NA Mechnical Tester I/F, Tester Model:NA Vacuum:NA DUT sizes:NA Tester Type (Used With):NAOEM 型号描述
Supports wafer sizes and shards from 0.5 in. (1 mm) to up to 12 in. (300mm) Semi-Automatic Probe Station文件
无文件
类别
Probers
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
130034
晶圆尺寸：
8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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FORM FACTOR / CASCADE MICROTECH / FRT
S300
类别
Probers
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
130034
晶圆尺寸：
8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Engineering Wafer Prober配置
Confirm Standard Configuration includes: Stage:12" Travel of Stage:301 mm x 301 mm Theta travel:± 7.5 degrees Microscope spec:Optem A-Zoom Options: Head Stage:NA Test Head Connection Jig:NA Ambient/Room Temp Chuck:-55°C to 200°C Heater ( Yes/No ):Yes (Thermal Controller and Chiller) GP-IB Interface:Yes RS232 Interface:NA Light Source:Yes Table:NA Manuals:NA Mechnical Tester I/F, Tester Model:NA Vacuum:NA DUT sizes:NA Tester Type (Used With):NAOEM 型号描述
Supports wafer sizes and shards from 0.5 in. (1 mm) to up to 12 in. (300mm) Semi-Automatic Probe Station文件
无文件