说明
Prober配置
无配置OEM 型号描述
300 mm Semi-/ Fully-automated Probe System. The CM300xi is a wafer probe station for wafer sizes up to 300 mm (12 inch). It meets the measurement challenges brought on by extremely complex requirements, such as unattended testing on small pads over time and at multiple temperatures.文件
无文件
类别
Probers
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121851
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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CM300xi
类别
Probers
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
121851
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Prober配置
无配置OEM 型号描述
300 mm Semi-/ Fully-automated Probe System. The CM300xi is a wafer probe station for wafer sizes up to 300 mm (12 inch). It meets the measurement challenges brought on by extremely complex requirements, such as unattended testing on small pads over time and at multiple temperatures.文件
无文件