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说明
Fully Automatic Prober with an inker配置
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEM 型号描述
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.文件
无文件
类别
Probers
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
29016
晶圆尺寸：
未知
年份：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
MARTEK / ELECTROGLAS (EG)
HORIZON 4085X
类别
Probers
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
29016
晶圆尺寸：
未知
年份：
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Fully Automatic Prober with an inker配置
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEM 型号描述
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.文件
无文件