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Suss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, SenTech STC-630AS camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II electronics module. Mfg 2008. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 4ea FormFactor DPP210 micromanipulators; Dell control PC; LED F3000 illumination source; ATT A300 temperature controller . 58in x 40in x 66in H.配置
无配置OEM 型号描述
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.文件
无文件
类别
Probers
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
123851
晶圆尺寸：
未知
年份：
2008
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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SUSS MicroTec / KARL SUSS
PA300
类别
Probers
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
123851
晶圆尺寸：
未知
年份：
2008
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Suss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, SenTech STC-630AS camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II electronics module. Mfg 2008. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 4ea FormFactor DPP210 micromanipulators; Dell control PC; LED F3000 illumination source; ATT A300 temperature controller . 58in x 40in x 66in H.配置
无配置OEM 型号描述
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.文件
无文件