说明
Prober Dual Load Port SH Communication Error配置
Software Version Rby00-R016.02U1 CIM: RS232 Process: Test Interface: FOUP Handler System: Pincette Options: D250 Chiller, CR385PH HTTD, LTI unit Tri - TempOEM 型号描述
The P-12XL Prober is a next-generation prober developed by TEL. It builds on the success of the P-8XL and shares the same interactive LCD Touch Panel Screen and On-axis Alignment. Additionally, it incorporates a FOUP loader, increased Z force, and higher accuracy, making it capable of tackling tomorrow’s technological challenges. The P-12XL has even been featured in the Semiconductor International article “Fabrication of the First Transistors on 300mm Wafers.文件
无文件
类别
Probers
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147366
晶圆尺寸：
12"/300mm
年份：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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TEL / TOKYO ELECTRON
P-12XL
类别
Probers
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147366
晶圆尺寸：
12"/300mm
年份：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Prober Dual Load Port SH Communication Error配置
Software Version Rby00-R016.02U1 CIM: RS232 Process: Test Interface: FOUP Handler System: Pincette Options: D250 Chiller, CR385PH HTTD, LTI unit Tri - TempOEM 型号描述
The P-12XL Prober is a next-generation prober developed by TEL. It builds on the success of the P-8XL and shares the same interactive LCD Touch Panel Screen and On-axis Alignment. Additionally, it incorporates a FOUP loader, increased Z force, and higher accuracy, making it capable of tackling tomorrow’s technological challenges. The P-12XL has even been featured in the Semiconductor International article “Fabrication of the First Transistors on 300mm Wafers.文件
无文件