说明
无说明配置
- Max. Scan Length : 30 mm - Max. Data Points : 120,000 - Stylus Force : 0.03~10mg (programmable) - 2.5 um Stylus Tip Radius Standard - Color Camera with fixed zoom 100X - Sample Thickness : 20 mm max. - Sample Size : 140mm diameter max. - Sample Translation : Manual Stage, X,Y Stage - 360 degree Rotation Stage(Manual) - Vertical Range : 400um - Vertical Resolution : 1 Å - 5Å RepeatabilityOEM 型号描述
The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.文件
无文件
类别
Profiler
上次验证： 2 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
155034
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
AMBIOS TECHNOLOGY, INC
XP-1
类别
Profiler
上次验证： 2 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
155034
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
- Max. Scan Length : 30 mm - Max. Data Points : 120,000 - Stylus Force : 0.03~10mg (programmable) - 2.5 um Stylus Tip Radius Standard - Color Camera with fixed zoom 100X - Sample Thickness : 20 mm max. - Sample Size : 140mm diameter max. - Sample Translation : Manual Stage, X,Y Stage - 360 degree Rotation Stage(Manual) - Vertical Range : 400um - Vertical Resolution : 1 Å - 5Å RepeatabilityOEM 型号描述
The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.文件
无文件