Tencor P-11 is a surface profiling tool designed for R&D applications. It can analyze surface topography over a 205 mm scan length on various surfaces, including semiconductor wafers and printed circuit boards. Its Open Frame configuration allows for measurement scans of large objects.

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

P-11

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Tencor P-11 Step Height Measurement System

- Installed in Clean-room.

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P-11

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