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说明
无说明配置
无配置OEM 型号描述
The Wyko NT9300 is an optical profiler that uses interferometric technology to measure surface topography. It is capable of high-speed measurements and is versatile enough to handle a wide range of sample types. The system is easy to set up and can be fully automated, with a user-defined pass/fail database. The NT9300 uses Veeco’s ninth-generation optical profiling sensor technology and can scan very large regions (up to 10 millimeters) for large or irregular samples. The system also features a dual-LED source for optimal performance, motorized XYZ, and a unique tip/tilt head for easy sample setup. The Wyko Vision software provides over 200 built-in analysis algorithms, as well as automated measurement sequences and data logging. Optional analysis packages include Film Analysis for transparent film measurements down to 100 nanometers.文件
无文件
类别
Profiler
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
113534
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
WYKO / VEECO
NT9300
类别
Profiler
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
113534
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The Wyko NT9300 is an optical profiler that uses interferometric technology to measure surface topography. It is capable of high-speed measurements and is versatile enough to handle a wide range of sample types. The system is easy to set up and can be fully automated, with a user-defined pass/fail database. The NT9300 uses Veeco’s ninth-generation optical profiling sensor technology and can scan very large regions (up to 10 millimeters) for large or irregular samples. The system also features a dual-LED source for optimal performance, motorized XYZ, and a unique tip/tilt head for easy sample setup. The Wyko Vision software provides over 200 built-in analysis algorithms, as well as automated measurement sequences and data logging. Optional analysis packages include Film Analysis for transparent film measurements down to 100 nanometers.文件
无文件