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KLA RS75
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
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    verified-listing-icon

    已验证

    类别
    Resistivity / Four Point Probe

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    115314


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    KLA

    RS75

    verified-listing-icon
    已验证
    类别
    Resistivity / Four Point Probe
    上次验证: 60 多天前
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/f2a983940adf42f2909b2930886a74b3_img0602_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/29dcd5a533d44c76aab7179f4d103ef8_img0596_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/a61971bd640a4f0b80b757e47ad63db6_img0601_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/d5159b4be0ac4c2da53b8be779608fdc_img0594_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/e7af9df8a3574f869d6e7e3f1fa397ed_img0597_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/35547753a39041a38ed50afa348a0970_img0598_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/2000781c16e64bf8a7541e7b684cc2da_img0599_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/ecbbdbdcf4e0406b88ce18bf49682edc_img0595_mw.jpg
    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    115314


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
    文件

    无文件