说明
无说明配置
无配置OEM 型号描述
The Thermo Scientific Helios NanoLab 1200AT DualBeam can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated FOUP Loader (AFL) allows the system to be located inside the semiconductor wafer fab, where it can deliver critical information up to three times faster than laboratory-based analysis.文件
无文件
类别
SEM / FIB
上次验证： 17 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
138746
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
HELIOS NANOLAB 1200AT
类别
SEM / FIB
上次验证： 17 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
138746
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The Thermo Scientific Helios NanoLab 1200AT DualBeam can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated FOUP Loader (AFL) allows the system to be located inside the semiconductor wafer fab, where it can deliver critical information up to three times faster than laboratory-based analysis.文件
无文件