说明
无说明配置
无配置OEM 型号描述
The Helios NanoLab 660 is a state-of-the-art DualBeam system developed by FEI. It combines the power of both ion and electron beams to provide FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) capabilities in a single machine. This system is designed to provide detailed, multi-dimensional insights at a sub-nanometer resolution. It incorporates the latest advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies, allowing for their combined use. As the 11th DualBeam platform from FEI, the Helios NanoLab 660 opens up new possibilities for extreme high-resolution 2D and 3D characterization, nanoprototyping, and high-quality sample preparation.文件
无文件
类别
SEM / FIB
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
133777
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
HELIOS NANOLAB 660
类别
SEM / FIB
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
133777
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The Helios NanoLab 660 is a state-of-the-art DualBeam system developed by FEI. It combines the power of both ion and electron beams to provide FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) capabilities in a single machine. This system is designed to provide detailed, multi-dimensional insights at a sub-nanometer resolution. It incorporates the latest advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies, allowing for their combined use. As the 11th DualBeam platform from FEI, the Helios NanoLab 660 opens up new possibilities for extreme high-resolution 2D and 3D characterization, nanoprototyping, and high-quality sample preparation.文件
无文件