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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50
    说明
    无说明
    配置
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM 型号描述
    Scanning Electron Microscope
    文件

    无文件

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon

    已验证

    类别
    SEM / FIB

    上次验证： 60 多天前

    物品主要详细信息
    状况：

    Used

    运行状况:

    Installed / Running

    产品编号：

    106592

    晶圆尺寸：

    8"/200mm

    年份：

    未知

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIB
    年份： 0状况： 二手
    上次验证60 多天前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon
    已验证
    类别
    SEM / FIB
    上次验证： 60 多天前
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/38dae80b71814bf38a53fc90587c4001_236677b67b9a49f496b86efa74f8c8a61201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/182dd0818a3c4f1ebcd2984df58fadad_4039d73b2f624fc38421d284403382061201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/f19cd4d7032b42afa4f4ca49ca31ac5e_e6751da9a7a440adba2a12ad59206d69_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/50d72f683ea34c459c3d7ca97e79b32b_984fc513ced24c68b8b4b97e2c0ca1dc_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/ff5806e127714b8a96b87b5df596e3b1_59947b8bf1cf4383a1e7bb42846a4d65_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/7a4ea99a073e479fa132a4e522459d03_c8c06cebf72d4a519cb388abe2986a9b_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/e0b80c59da634d99822f2da87afdcc1f_457737e8432b4a829c675216985da2c4_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/8b82e9f60e984966b66013297f2ea9b2_c32f68d622e34971aa078c1f85f9f2521201a_mw.jpeg
    物品主要详细信息
    状况：

    Used

    运行状况:

    Installed / Running

    产品编号：

    106592

    晶圆尺寸：

    8"/200mm

    年份：

    未知

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM 型号描述
    Scanning Electron Microscope
    文件

    无文件

    类似上架物品
    查看全部
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIB年份： 0状况： 二手上次验证：60 多天前