说明
ANALYTICAL EQUIPMENT配置
FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)OEM 型号描述
200 kV dedicated STEM for semiconducting industry, materials science and biological science.文件
无文件
HITACHI
HD-2300
已验证
类别
SEM / FIB
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
20309
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
HD-2300
类别
SEM / FIB
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
20309
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
ANALYTICAL EQUIPMENT配置
FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)OEM 型号描述
200 kV dedicated STEM for semiconducting industry, materials science and biological science.文件
无文件