说明
SEM配置
SEM, Large Sample Chamber (maximum 300mm diameter), 5-axis MD, Camera Navigation, Secondary/Reflection Electrons, Low Vacuum Secondary Electron Detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470OEM 型号描述
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.文件
无文件
HITACHI
S-3700N
已验证
类别
SEM / FIB
上次验证： 20 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116067
晶圆尺寸：
未知
年份：
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-3700N
类别
SEM / FIB
上次验证： 20 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116067
晶圆尺寸：
未知
年份：
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
SEM配置
SEM, Large Sample Chamber (maximum 300mm diameter), 5-axis MD, Camera Navigation, Secondary/Reflection Electrons, Low Vacuum Secondary Electron Detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470OEM 型号描述
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.文件
无文件