说明
Experience the precision and power of the Hitachi S-4800-1 Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable operation and a broad field of view, ideal for both laboratory and industrial applications. Equipped with advanced features, the S4800-1 model offers exceptional image quality and resolution, making it a go-to instrument for researchers and technicians in various fields. Whether you’re examining surfaces or conducting material studies, this SEM is engineered to deliver reliable and accurate results.配置
无配置OEM 型号描述
The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.文件
无文件
类似上架物品
查看全部
HITACHI
S-4800
类别
SEM / FIB
上次验证： 7 天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
142450
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Experience the precision and power of the Hitachi S-4800-1 Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable operation and a broad field of view, ideal for both laboratory and industrial applications. Equipped with advanced features, the S4800-1 model offers exceptional image quality and resolution, making it a go-to instrument for researchers and technicians in various fields. Whether you’re examining surfaces or conducting material studies, this SEM is engineered to deliver reliable and accurate results.配置
无配置OEM 型号描述
The S-4800 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) that builds upon the proven performance of its predecessors, the S-4700 and S-5200. With beam deceleration technology, it achieves an impressive resolution of 1.4 nm at 1 kV and 1.0 nm at 15 kV. The microscope features a semi-in-lens detector design, allowing for the examination of large samples without compromising ultra-high resolution at low accelerating voltages. The innovative objective lens design incorporates Hitachi's Super ExB filter technology, which effectively separates pure secondary electrons (SE), compositional SE, and backscattered electron (BSE) signals. With a specimen diameter of 200 mm and a 5-axis motorized eucentric stage, it offers exceptional sample accommodation and positioning capabilities. The S-4800 is compatible with optional accessories such as Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscatterted Diffraction Pattern (EBDP) systems, making it suitable for a range of ultra-high resolution applications in fields like semiconductor research, materials studies, and nanotechnology.文件
无文件