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HITACHI S-7000
  • HITACHI S-7000
  • HITACHI S-7000
  • HITACHI S-7000
  • HITACHI S-7000
  • HITACHI S-7000
说明
The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during the various process steps. Non-destructive wafer inspection is ideal for observing complete wafers to identify problems such as stacking-faults, deep holes, etc. Wafer Size: Accommodates 4", 5" and 6" wafers. Set size = 5". Secondary Electron Image Resolution: 15nm (150 angstroms) at 1kV Magnification: 100x to 100,000x CD Measurement Range: 0.05 to 100 microns Electron Beam Source: Field emission electron gun Accelerating Voltage(V0): 0.7~3kV (in increments of 100V) Emission Extracting Voltage(V1): 0~6.3kV Lens System: 2-stage electromagnetic lens reduction Objective Lens Aperture: Moveable type(4 openings selectable and alignable outside column Stigmator: 8-pole electromagnetic type(X,Y) Scanning Coil: 2-stage electromagnetic type Specimen Stage Movement: X-direction = 150nm, Y-direction = 150nm, Z-direction (working distance) = 5 to 15mm, T (tilt) angle = 0 to 60 degrees, R (rotation) angle = 360 degrees Wafer Holder: Holder replaceable for each wafer size Wafer Setting: Auto vacuum chucking using orientation flat reference Wafer Transfer: Wafer cassette to wafer holder in loader chamber (automatic) Auto Loader: Single-cassette loading, random accessing
配置
无配置
OEM 型号描述
未提供
文件

无文件

PREFERRED
 
SELLER
verified-listing-icon

已验证

类别
SEM / FIB

上次验证: 60 多天前

Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

125823


晶圆尺寸:

未知


年份:

1991


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

HITACHI

S-7000

verified-listing-icon
已验证
类别
SEM / FIB
上次验证: 60 多天前
listing-photo-f5099926a3f640189906ab4f0f624afe-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1878/f5099926a3f640189906ab4f0f624afe/b2dd552bc68f4739981fe8039afb40f5_screenshot20250321at10_mw.png
listing-photo-f5099926a3f640189906ab4f0f624afe-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1878/f5099926a3f640189906ab4f0f624afe/c90c37e1a0c448e3aa57538302d132be_screenshot20250321at10_mw.png
listing-photo-f5099926a3f640189906ab4f0f624afe-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1878/f5099926a3f640189906ab4f0f624afe/c855b6af88c14f59bcf9a5a848ddee96_screenshot20250321at10_mw.png
listing-photo-f5099926a3f640189906ab4f0f624afe-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1878/f5099926a3f640189906ab4f0f624afe/824f15cf2b674072a6469259f122c626_screenshot20250321at10_mw.png
listing-photo-f5099926a3f640189906ab4f0f624afe-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1878/f5099926a3f640189906ab4f0f624afe/4fdd742adedb41e1bf3f2683fc2c31cb_screenshot20250321at10_mw.png
Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

125823


晶圆尺寸:

未知


年份:

1991


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during the various process steps. Non-destructive wafer inspection is ideal for observing complete wafers to identify problems such as stacking-faults, deep holes, etc. Wafer Size: Accommodates 4", 5" and 6" wafers. Set size = 5". Secondary Electron Image Resolution: 15nm (150 angstroms) at 1kV Magnification: 100x to 100,000x CD Measurement Range: 0.05 to 100 microns Electron Beam Source: Field emission electron gun Accelerating Voltage(V0): 0.7~3kV (in increments of 100V) Emission Extracting Voltage(V1): 0~6.3kV Lens System: 2-stage electromagnetic lens reduction Objective Lens Aperture: Moveable type(4 openings selectable and alignable outside column Stigmator: 8-pole electromagnetic type(X,Y) Scanning Coil: 2-stage electromagnetic type Specimen Stage Movement: X-direction = 150nm, Y-direction = 150nm, Z-direction (working distance) = 5 to 15mm, T (tilt) angle = 0 to 60 degrees, R (rotation) angle = 360 degrees Wafer Holder: Holder replaceable for each wafer size Wafer Setting: Auto vacuum chucking using orientation flat reference Wafer Transfer: Wafer cassette to wafer holder in loader chamber (automatic) Auto Loader: Single-cassette loading, random accessing
配置
无配置
OEM 型号描述
未提供
文件

无文件