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说明
SEM配置
SEM, Secondary Electron Detector, Reflection Electron Detector, Low Vacuum Secondary Electron Detector, EDX (AMETEC Octane Plus), MC1000 ion Sputter, Etc.OEM 型号描述
SU3500 low-vacuum SEM, Hitachi High-Tech improved SEM image observation capacity by completely overhauling the electron optics system, enabling secondary electron imaging at a resolution of 7 nm at 3 kV, and back-scattered electron imaging at a resolution of 10 nm at 5 kV. Redesigned signal processing technology, meanwhile, allows for observation of brighter images with less noise even during fast scanning speeds. These key changes now make it possible to retain a high degree of operability even when focusing or stigma adjustments.文件
无文件
HITACHI
SU3500
类别
SEM / FIB
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116070
晶圆尺寸：
未知
年份：
2016
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说明
SEM配置
SEM, Secondary Electron Detector, Reflection Electron Detector, Low Vacuum Secondary Electron Detector, EDX (AMETEC Octane Plus), MC1000 ion Sputter, Etc.OEM 型号描述
SU3500 low-vacuum SEM, Hitachi High-Tech improved SEM image observation capacity by completely overhauling the electron optics system, enabling secondary electron imaging at a resolution of 7 nm at 3 kV, and back-scattered electron imaging at a resolution of 10 nm at 5 kV. Redesigned signal processing technology, meanwhile, allows for observation of brighter images with less noise even during fast scanning speeds. These key changes now make it possible to retain a high degree of operability even when focusing or stigma adjustments.文件
无文件