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HITACHI SU8000
  • HITACHI SU8000
说明
无说明
配置
无配置
OEM 型号描述
FE-SEM The new SU8000 features a top detector along with a semi-in-lens type of objective lens. This technology is a further advance on the popular upper backscattered electron detector used in the S-5500. By combining the top detector with the conventional upper detector technology, Hitachi has now developed a new signal detection system for optimum contrast visualization of signals, generated from the sample. These signals include secondary electrons, low-angle backscattered electrons and high-angle backscattered electrons, which are acquired for observation of surface structures.
文件

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verified-listing-icon

已验证

类别
SEM / FIB

上次验证: 30 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

126951


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

HITACHI

SU8000

verified-listing-icon
已验证
类别
SEM / FIB
上次验证: 30 多天前
listing-photo-40223624595a4e2ab1a9bf0d10210fe9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/79856/40223624595a4e2ab1a9bf0d10210fe9/f3477ccb32644ba2870eeba0f2883970_su8000_mw.jpg
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

126951


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
无配置
OEM 型号描述
FE-SEM The new SU8000 features a top detector along with a semi-in-lens type of objective lens. This technology is a further advance on the popular upper backscattered electron detector used in the S-5500. By combining the top detector with the conventional upper detector technology, Hitachi has now developed a new signal detection system for optimum contrast visualization of signals, generated from the sample. These signals include secondary electrons, low-angle backscattered electrons and high-angle backscattered electrons, which are acquired for observation of surface structures.
文件

无文件