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HITACHI NB5000
    说明
    Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
    配置
    Resolution: SEM: 1.0 nm at 15 kV FIB: 5 nm at 40 kV FIB Column: Ga Ion source: >50 nA 2-Stage electro static lens system Octopole electro static lens system Pattern generator system: 4K x 4K SEM Column: Maximum beam current: >30 nA 3-Stage electro magnetic lens reduction system Electro static blanking system SE Power supply Image memory: 2560 x 1920 Vacuum system: Turbo molecular pump Dry pump Ion source chamber Electron gun (2) Buffer tanks Micro-sampling system: 3-Axis motor drive system X Range: 1 mm Y Range: 2 mm Z Range: 2.5 mm Chamber scope: LCD Monitor, 7" Stand IR Camera Power cable AC / DC Adaptor Air compressor N2 Gas leak system Multi-stage control panel Console control unit Power supply unit AC Power distribution Transformer Laser sample height adjust tool Manual sample height adjust tool Interlock function PC Processor: INTEL i7 Flat panel LCD Monitor, 22" Mouse Keyboard Control panel RAM: 16 GB Hard Disk Drive (HDD): 500 GB Does not include EDS Operating system: Windows 7, 64-Bit
    OEM 型号描述
    未提供
    文件

    无文件

    verified-listing-icon

    已验证

    类别
    SEM / FIB

    上次验证: 16 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    138358


    晶圆尺寸:

    未知


    年份:

    2018


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
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    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIB
    年份: 2018状况: 二手
    上次验证今天

    HITACHI

    NB5000

    verified-listing-icon
    已验证
    类别
    SEM / FIB
    上次验证: 16 天前
    listing-photo-ea2c6480c17c40ee89e6c837a92baee5-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    138358


    晶圆尺寸:

    未知


    年份:

    2018


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
    配置
    Resolution: SEM: 1.0 nm at 15 kV FIB: 5 nm at 40 kV FIB Column: Ga Ion source: >50 nA 2-Stage electro static lens system Octopole electro static lens system Pattern generator system: 4K x 4K SEM Column: Maximum beam current: >30 nA 3-Stage electro magnetic lens reduction system Electro static blanking system SE Power supply Image memory: 2560 x 1920 Vacuum system: Turbo molecular pump Dry pump Ion source chamber Electron gun (2) Buffer tanks Micro-sampling system: 3-Axis motor drive system X Range: 1 mm Y Range: 2 mm Z Range: 2.5 mm Chamber scope: LCD Monitor, 7" Stand IR Camera Power cable AC / DC Adaptor Air compressor N2 Gas leak system Multi-stage control panel Console control unit Power supply unit AC Power distribution Transformer Laser sample height adjust tool Manual sample height adjust tool Interlock function PC Processor: INTEL i7 Flat panel LCD Monitor, 22" Mouse Keyboard Control panel RAM: 16 GB Hard Disk Drive (HDD): 500 GB Does not include EDS Operating system: Windows 7, 64-Bit
    OEM 型号描述
    未提供
    文件

    无文件

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    查看全部
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    SEM / FIB年份: 2018状况: 二手上次验证:16 天前