说明
无说明配置
无配置OEM 型号描述
The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.文件
无文件
JEOL
JEM-2010F
已验证
类别
SEM / FIB
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
70438
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JEM-2010F
类别
SEM / FIB
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
70438
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.文件
无文件