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JEOL JSM-6490LV
  • JEOL JSM-6490LV
  • JEOL JSM-6490LV
  • JEOL JSM-6490LV
说明
Scanning Electron Microscope (SEM)
配置
无配置
OEM 型号描述
Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
文件

无文件

类别
SEM / FIB

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

97745


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

JEOL

JSM-6490LV

verified-listing-icon
已验证
类别
SEM / FIB
上次验证: 60 多天前
listing-photo-2832b74909f04de6b73dadbfeaf9136e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

97745


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Scanning Electron Microscope (SEM)
配置
无配置
OEM 型号描述
Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
文件

无文件