说明
Performance Resolution: 6 nm (30 kV, WD = 8 mm, secondary electron image). Magnification: 15x (WD = 48 mm) 200,000x, provided with an automatic magnification correction device. Imaging signals: Secondary electrons, backscattered electrons.配置
SEM system, JEOL JSM T300 electron microscope.OEM 型号描述
未提供文件
JEOL
JSM-T300
类别
SEM / FIB
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
Installed / Idle
产品编号：
150627
晶圆尺寸：
未知
年份：
1
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available