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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS STRATA 400
    说明
    spare parts.
    配置
    无配置
    OEM 型号描述
    FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    STRATA 400

    verified-listing-icon

    已验证

    类别
    SEM

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Parts Tool


    运行状况:

    未知


    产品编号:

    104220


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS STRATA 400

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    STRATA 400

    SEM
    年份: 0状况: 零件工具
    上次验证60 多天前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    STRATA 400

    verified-listing-icon
    已验证
    类别
    SEM
    上次验证: 60 多天前
    listing-photo-73930c4ac5944b01828e9673942b4775-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Parts Tool


    运行状况:

    未知


    产品编号:

    104220


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    spare parts.
    配置
    无配置
    OEM 型号描述
    FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.
    文件

    无文件

    类似上架物品
    查看全部
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS STRATA 400

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    STRATA 400

    SEM年份: 0状况: 零件工具上次验证:60 多天前