说明
无说明配置
- EDS: Yes EDAX/ Model: Apollo XP Detectors: - Everhart thornley secondary electron detector - High sensitivity semiconductor BSE detector OS：SEM/Windows 7, EDX/Windows7 Accessories: Carbon Coater (VC-100)OEM 型号描述
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.文件
无文件
HITACHI
S-3700N
已验证
类别
SEM
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
87020
晶圆尺寸：
未知
年份：
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-3700N
已验证
类别
SEM
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
87020
晶圆尺寸：
未知
年份：
2011
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
- EDS: Yes EDAX/ Model: Apollo XP Detectors: - Everhart thornley secondary electron detector - High sensitivity semiconductor BSE detector OS：SEM/Windows 7, EDX/Windows7 Accessories: Carbon Coater (VC-100)OEM 型号描述
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.文件
无文件