跳至主要内容
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
HITACHI S-4700 II
    说明
    无说明
    配置
    FE Sem with Horriba EMAX EDX
    OEM 型号描述
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
    文件

    无文件

    HITACHI

    S-4700 II

    verified-listing-icon

    已验证

    类别
    SEM

    上次验证: 2 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    116940


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM
    年份: 2001状况: 二手
    上次验证60 多天前

    HITACHI

    S-4700 II

    verified-listing-icon
    已验证
    类别
    SEM
    上次验证: 2 天前
    listing-photo-b2f778c396fd4b099a903ddc59ee3aa2-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    116940


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    FE Sem with Horriba EMAX EDX
    OEM 型号描述
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
    文件

    无文件

    类似上架物品
    查看全部
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM年份: 2001状况: 二手上次验证:60 多天前
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM年份: 0状况: 二手上次验证:2 天前
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM年份: 2000状况: 二手上次验证:2 天前