说明
ANALYTICAL EQUIPMENT配置
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM 型号描述
Field Emission Scanning Electron Microscope文件
无文件
HITACHI
S-4800 II
已验证
类别
SEM
物品主要详细信息
状况:
Refurbished
运行状况:
未知
产品编号:
36384
晶圆尺寸:
8"/200mm
年份:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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S-4800 II
已验证
类别
SEM
上次验证: 60 多天前
物品主要详细信息
状况:
Refurbished
运行状况:
未知
产品编号:
36384
晶圆尺寸:
8"/200mm
年份:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
ANALYTICAL EQUIPMENT配置
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM 型号描述
Field Emission Scanning Electron Microscope文件
无文件